Information Request Page
You've added
items
View All Items List
Company
About Us
News & Events
Press Releases
Seminars
Trade Shows
Employment
Products
Probe Stations
By Wafer Size
150mm (6”)
200mm (8”)
300mm (12”)
By Series
Pro Series 300mm Stations
8000 High Performance Series Stations
4000 Technical Series Stations
By Type
Manual
Motorized
Semi-Automatic (Programmable)
Probe Holders & Tips
Probe Holders By Application
General Purpose
Triaxial
Kelvin
Low Capacitance
High Frequency
Microwave
High Impedance (Active Probes)
Thin Film
Cutting
Hot Stage
Low Profile Probing
Probe Holders By Model
Probe Tips By Application
General Purpose
Low Resistance Probing, High current/voltage probing
Delicate target or surface, soft tip with low resistance
Sub-micron targets
High compliance, Thermal applications
Low compliance, Lightly passivated or oxidized surfaces
High Frequency
Cutting
Probe Tips By Model
Picoprobe® High Frequency/Microwave Probes
Chucks & Thermal Systems
Ambient & Thermal Chucks
Ambient Chucks
Thermal Chucks
Microscopes & Video Systems
High Magnification/Compound Microscopes
Video Systems
Manipulators
Probe Card Holders
Laser & Ultrasonic Cutters
Vibration Control
Light/EMI/RFI/Moisture Shields
Applications
Failure Analysis
Fault Isolation
Laser Cutting
Characterization & Modeling
Wafer Level
Reliability Testing
Copper Interconnect (Via) Reliability
Electromigration/Metal Stress Voiding
Hot Carrier Injection (HCI) / Charge Pumping
Negative Bias Temperature Instability - NBTI (PTBI)
Oxide Wear-Out - TDDB, CVS, CCS
IV/CV Testing
Low Current
High Voltage/High Current
High Temperature/Low Temperature Probing
RF Microwave
Where to Buy
Refurbished Equipment
Stations
Chucks
Manipulators
Microscopes
Support
Application Notes
Service Request
Mailing List
Contact
Home
›
Applications
Please click on a subcategory below:
Failure Analysis
Fault Isolation
Laser Cutting
Characterization & Modeling
Wafer Level
Reliability Testing
Copper Interconnect (Via) Reliability
Electromigration/Metal Stress Voiding
Hot Carrier Injection (HCI) / Charge Pumping
Negative Bias Temperature Instability - NBTI (PTBI)
Oxide Wear-Out - TDDB, CVS, CCS
IV/CV Testing
Low Current
High Voltage/High Current
High Temperature/Low Temperature Probing
RF Microwave
Where to Buy
Ready to purchase our products?
Find a sales rep
near you or check our
used equipment sale
for great deals on demo, refurbished and discontinued equipment.
