Semiconductor characterization typically requires IV (current vs voltage) measurements in ultra-low current (<1 femtoamp).
Micromanipulator offers a total systems approach to low current / low noise measurements to insure a proper configuration. A IV / CV Probing Seminar
is available on a CD-ROM addresses low current / low noise tests. It includes a section on diagnosing test setup problems. You may request this seminar through this web site or through your local sales representative.
Low current IV measurements
are concerned with ultra-low current leakage. Low level current measurements require shielding and control of the test environment. Precise low current measurements in the femtoamp and attoamp range typically require the use of triaxial Kelvin probes/probe holders with force and sense connections to control the leakage currents. Low current measurements are also sensitive to vibrations which can result in varying resistance at the probe tip and induced currents in the system cables.
Probe Station IV Measurement Challenges
- Low-noise construction of cables, probe/probe holders and station to remove stray currents from the measurement.
- Triaxial Kelvin probes/probe holders to provide a clean connection from the measurement instrument to the device under test (DUT).
- Light/EMI shielding is needed to protect light and EMI sensitive test devices from interference.
- Vibration isolation systems are needed to reduce or eliminate vibration induced changes in the test results.