P300L Semi-Automatic Probe Station

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  • 300mm semiautomatic wafer prober
  • NETPROBE-7 control software included (wafer map, sub-die, video, theta alignment, pattern recognition)
  • Drivers for popular testers from companies like Keysight and Keithley
  • Configurable for DC, RF, Microwave, and High Power applications
  • -55C to 300C configurable

Description

P300L Semiautomatic Probe Station

The Micromanipulator P300L 300mm semiautomatic probe station comes standard with features such as single-point ground and integrated thermal chuck plumbing. Built for reliability as well as precision, the P300L features leadscrew – leadnut stage and platen drives, a stainless-steel platen with removable front wedge and high stability microscope bridge that supports all high resolution long-working distance microscopes.

The P300L ‘s versatile controller supports USB and GPIB communications (configured with proper options). The stage X-Y and platen (Z) are motorized / programmable. Microscope motorized / programmable control is also an option. The system may be controlled via scripts and all popular parametric test analytical prober drivers.

Micromanipulator strives to ensure our semiautomatic systems are flexible so that applications like low current, low capacitance, 1/f,  hot and cold testing, long term reliability, high power, high frequency, mmW, MEMS, magnetic sensitivity testing, high-speed pulse dynamic I/V analysis and more can be accomplished with ease. The P300L allows you to automate testing plans for maximum efficiency and large data set acquisition without user intervention.

Joystick control allows for easy and quick operation when programmability is not required. The joystick intuitively operates the station stage, platen, and microscope for systems so configured.

Use the P300L with probe cards, individual probes, or both together!

The P300L may be configured with a local dry / shielded / dark environment “Top Hat” for low level or low temperature, frost free probing. Three temperature ranges are supported:

  • Ambient (room temperature) to 300C
  • 0C to 300C
  • -55C to 300C

The P300L is the station of choice for a high performance, full capability, first in class flexibility, and cost-effective 300 mm semi-automatic probe station.

Additional information

System

System Capability

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System Control

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System Value Considerations

Product Documents

P300L rev B press