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General Contact Info

Contact Info by Department

Failure Analysis
Wafer Level Reliability
Device Characterization
Process Modeling
Process Monitoring (i.e. CV)
Emission Microscopy
Packaged Part Probing
Flat Panel Probing
PC Board or Hybrid Probing
Low Noise/Low Current Measurement Information
Integrated Probe Station with Agilent's 4085 Switch Matrix
Microwave Probing
MEMS Test/Assembly
Bio-Tech/Micro-Fluidics
High Volt/Current
High/Low Temperature
IV/CV Testing
Thin Film Tests
Optical Device Tests
Test Head Probing
Other