High Performance Manual Probe Stations

High Performance Manual Probe Stations

Model Wafer Size Control Accessory Options Upgrade Path Target Applications Value
450PM 4-6-8” Manual
  • Hot Chuck
  • LTE
  • Probe Card (A)
450PM-MW/HR4060
  • General Purpose
  • RF / DC
  • Low Acquisition Costs
  • Economy
  • Flexible upgrade
450PM-MW 4-6-8” Manual
  • Hot Chuck
  • LTE
  • Probe Card (A)
450PM-HR4060
  • General Purpose
  • RF / DC
  • Low Acquisition Costs
  • Economy
  • Flexible upgrade
450PM-HR 4-6-8” Manual
  • Hot Chuck
  • LTE
  • Probe Card (A)
  • Laser / Micrometer
450PM-HR (w/laser microscope) 4060
  • General Purpose
  • RF / DC
  • High Magnification
  • Laser/ Liquid Crystal
  • Low Acquisition Costs
  • Economy
  • Flexible upgrade
4060 4-6-8” Manual
  • HotChuck
  • ColdChuck
  • LTE
  • ProbeCard
  • Laser/ Micrometer
TradeIn
  • General Purpose
  • RF / DC
  • Failure Analysis
  • Reliability
  • General device characterization
  • Good price versus performance
  • Medium acquisition cost with good application coverage
  • Good COO for general purpose applications
8060 4-6-8” Manual
  • FailureAnalysis
  • Reliability
  • Low Current Device Characterization
  • Industry leading performance
  • Excellent COO for high performance applications
  • The most comprehensive application coverage including low current.
  • Best low current performance

Showing all 4 results

  • 4060 (150-200mm) High Performance Manual Probe Station

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  • 8060 (150-200mm) High Performance Manual Probe Station

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  • P300J (200mm-300mm) Motorized Manual Probe Station

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  • 450PM-HR (150-200mm) High Performance Manual Probe Station

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