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Another industry first from Micromanipulator – patented 2210 application board probe station with above/below ambient temperature stress to address todays advanced system level FA challenges.

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We offer the most comprehensive selection of analytical probing hardware, including the most versatile probe station available on the market today, the patented model 2210.

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We leverage 60 years of analytical probing experience with state of the art design, test, and manufacturing capability.

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From product development at the wafer level to post tape out failure analysis at the packaged part, those who know choose Micromanipulator.

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The first name in analytical probing, Micromanipulator delivers the tools and life cycle support the semiconductor industry depends on. We’re proud to be a partner in our customer’s success. Together we continually advance the state of the art and give our customers the tools they need to develop the products of tomorrow.

Featured: 2210-LS Application Board Probe Station

Featured: 2210-LS Application Board Probe Station
The worlds first true system level probe station with above and below ambient temperature capabilities.

Chip spins driven by the results of first-article testing of new chip designs are usually accompanied by extremely high pressure from senior management and customers to find solutions within truncated timeframes. However, application boards used as part of a post tape out test plan are not suitable for in-circuit probing with traditional techniques that have been optimized for the wafer level.

The Micromanipulator model 2210-LS application board compatible probe station has been specifically designed to migrate wafer level probe capability to the system level application board to assist with post tape-out product spins. Use of application boards for system level probing can significantly expedite identification of root cause.

The 2210-LS enables you to probe on your application board at above and below ambient temperatures without limiting your boards ability to exercise your chip and without limiting the probing capability employed at the wafer level. Using the 2210-LS, you can trace and analyze issues that manifest only in the actual end application environment faster, easier, and with less headache than previously possible.

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